High-speed image processing for industrial quality assurance

Emergent Vision Technologies, Inc. from Vancouver (Canada) is showcasing various high-speed cameras that can be used reliably with high resolution even in high-volume production environments. The »EROS 10GigE camera« is characterized above all by its small size of 29 mm x 29 mm and its low power consumption (from 3 W), while the new »16K TDI Line-Scan-Camera« can operate with high resolution (16,384 pixels per line) and at a speed of up to 1 MHz line rate. Typical fields of application can be found in semiconductor production, printing and web inspection.

The »EROS 10GigE camera« is equipped with Power over Ethernet (PoE) via a BaseT/RJ45 connection and SFP+ fiber optic interfaces. With values from 3 W, the energy consumption is low and ensures that the camera housing does not heat up too much. This means that multi-camera setups are also possible without complex cooling concepts. The system can be equipped with a wide variety of image sensors, with frame rates ranging from 35 fps to 1586 fps. Sensors with different wavelength ranges can also be installed, such as SWIR CMOS image sensors that capture images in the SWIR range (400 to 1700 nm). These cameras aim to detect materials and substances that are invisible to the human eye. The camera series was developed for high-speed applications and is equipped with »Zero-Copy-Technology«. This means that the images obtained do not have to be copied, thus reducing the processing effort. This is particularly important for applications with multiple cameras. Real-time data processing with GPU Direct also enables immediate analysis without delays caused by CPU bottlenecks.

»Zero-Copy-Technology« and real-time data processing with GPU Direct are also possible in the »16K TDI Line-Scan-Camera«. The TDI sensors can also detect fast-moving objects in low-light conditions while maintaining a high signal-to-noise ratio. Even demanding applications can be solved without the risk of image degradation. This system is particularly suitable for precise inline inspection applications, e.g. in semiconductor inspection or web inspection.