ALBATROSS-TT Table-Top System

System description

The new table top system (3D-Arrangement for Laser Based Transmittance, Reflectance and Optical Scatter measurement - Table Top) enables high sensitive measurements of angle resolved light scattering, reflectance and transmittance of optical and non-optical surfaces, materials and components within the entire 3D-sphere.

Measurement system ALBATROSS-TT
Measurement system ALBATROSS-TT

Applications

Characterization of surfaces, coatings, and materials:

  • Quality control, appearance
  • Optical performance
  • Roughness analysis
3D reflectance and scattering distribution of a gemstone with facets
3D reflectance and scattering distribution of a gemstone with facets

Specifications

  • Measurement of light scattering (ARS, BRDF, BTDF, scatter loss), Θ-2Θ , R and T
  • Full 3D-spherical measurement capability
  • In- and out-of-plane mode
  • Flexible variation of incident angle, scattering angle (azimuth and polar angles), and polarization
  • Area raster scans of sample surface
  • Housed table top system < 1 m³
  • Dynamic range: 13 orders of magnitude
  • Noise equivalent ARS: 3x10-08 sr-1
  • Roughness equivalent sensitivity: < 0.1 nm
  • Wavelength: 532 nm (other wavelengths on demand)
  • User-friendly software for measurement control and data analysis
  • Analysis tools: roughness, PSD, etc.
Examples of angle resolved scattering
Examples of angle resolved scattering (ARS) measurements (azimuth angle 0°) in reflection and transmission hemispheres